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Journal: Algorithms, 2022
Volume: 15
Number: 102

Article: Dynamic Line Scan Thermography Parameter Design via Gaussian Process Emulation
Authors: by Simon Verspeek, Ivan De Boi, Xavier Maldague, Rudi Penne and Gunther Steenackers
Link: https://www.mdpi.com/1999-4893/15/4/102

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