Topographic, Thermal and Chemical Characterization of Oxidized Cu and Cu-Ag Thin Films
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Carrupt, M.C.; Ferraria, A.M.; Serro, A.P.; Piedade, A.P. Topographic, Thermal and Chemical Characterization of Oxidized Cu and Cu-Ag Thin Films. Materials 2025, 18, 4562. https://doi.org/10.3390/ma18194562
Carrupt MC, Ferraria AM, Serro AP, Piedade AP. Topographic, Thermal and Chemical Characterization of Oxidized Cu and Cu-Ag Thin Films. Materials. 2025; 18(19):4562. https://doi.org/10.3390/ma18194562
Chicago/Turabian StyleCarrupt, Maria C., Ana M. Ferraria, Ana P. Serro, and Ana P. Piedade. 2025. "Topographic, Thermal and Chemical Characterization of Oxidized Cu and Cu-Ag Thin Films" Materials 18, no. 19: 4562. https://doi.org/10.3390/ma18194562
APA StyleCarrupt, M. C., Ferraria, A. M., Serro, A. P., & Piedade, A. P. (2025). Topographic, Thermal and Chemical Characterization of Oxidized Cu and Cu-Ag Thin Films. Materials, 18(19), 4562. https://doi.org/10.3390/ma18194562