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Journal: Materials, 2024
Volume: 17
Number: 1350

Article: Defects Contributing to Hysteresis in Few-Layer and Thin-Film MoS2 Memristive Devices
Authors: by Saadman Abedin, Vladislav Kurtash, Sobin Mathew, Sebastian Thiele, Heiko O. Jacobs and Jörg Pezoldt
Link: https://www.mdpi.com/1996-1944/17/6/1350

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