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Journal: Materials, 2023
Volume: 16
Number: 1868

Article: Sensitivity of Al-Doped Zinc-Oxide Extended Gate Field Effect Transistors to Low-Dose X-ray Radiation
Authors: by Amal Mohamed Ahmed Ali, Naser M. Ahmed, Norlaili A. Kabir, Ahmad M. AL-Diabat, Natheer A. Algadri, Ahmed Alsadig, Osamah A. Aldaghri and Khalid H. Ibnaouf
Link: https://www.mdpi.com/1996-1944/16/5/1868

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