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Article

Optical Characterization of Thin Films by Surface Plasmon Resonance Spectroscopy Using an Acousto-Optic Tunable Filter

by
Ildus Sh. Khasanov
1,*,
Boris A. Knyazev
2,*,
Sergey A. Lobastov
1,
Alexander V. Anisimov
1,
Pavel A. Nikitin
1 and
Oleg E. Kameshkov
2
1
Scientific and Technological Centre of Unique Instrumentation RAS, 117342 Moscow, Russia
2
Budker Institute of Nuclear Physics SB RAS, 630090 Novosibirsk, Russia
*
Authors to whom correspondence should be addressed.
Materials 2023, 16(5), 1820; https://doi.org/10.3390/ma16051820
Submission received: 9 December 2022 / Revised: 20 February 2023 / Accepted: 21 February 2023 / Published: 22 February 2023
(This article belongs to the Special Issue Acousto-Optical Spectral Technologies)
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Abstract

The paper presents the application of the acousto-optic tunable filter (AOTF) in surface plasmon resonance (SPR) spectroscopy to measure the optical thickness of thin dielectric coatings. The technique presented uses combined angular and spectral interrogation modes to obtain the reflection coefficient under the condition of SPR. Surface electromagnetic waves were excited in the Kretschmann geometry, with the AOTF serving as a monochromator and polarizer of light from a white broadband radiation source. The experiments highlighted the high sensitivity of the method and the lower amount of noise in the resonance curves compared with the laser light source. This optical technique can be implemented for nondestructive testing in the production of thin films in not only the visible, but also the infrared and terahertz ranges.
Keywords: acousto-optic; tunable filter; surface plasmon resonance; surface electromagnetic wave spectroscopy; thin film thickness; wavelength and angular interrogation; refractive index sensing acousto-optic; tunable filter; surface plasmon resonance; surface electromagnetic wave spectroscopy; thin film thickness; wavelength and angular interrogation; refractive index sensing
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MDPI and ACS Style

Khasanov, I.S.; Knyazev, B.A.; Lobastov, S.A.; Anisimov, A.V.; Nikitin, P.A.; Kameshkov, O.E. Optical Characterization of Thin Films by Surface Plasmon Resonance Spectroscopy Using an Acousto-Optic Tunable Filter. Materials 2023, 16, 1820. https://doi.org/10.3390/ma16051820

AMA Style

Khasanov IS, Knyazev BA, Lobastov SA, Anisimov AV, Nikitin PA, Kameshkov OE. Optical Characterization of Thin Films by Surface Plasmon Resonance Spectroscopy Using an Acousto-Optic Tunable Filter. Materials. 2023; 16(5):1820. https://doi.org/10.3390/ma16051820

Chicago/Turabian Style

Khasanov, Ildus Sh., Boris A. Knyazev, Sergey A. Lobastov, Alexander V. Anisimov, Pavel A. Nikitin, and Oleg E. Kameshkov. 2023. "Optical Characterization of Thin Films by Surface Plasmon Resonance Spectroscopy Using an Acousto-Optic Tunable Filter" Materials 16, no. 5: 1820. https://doi.org/10.3390/ma16051820

APA Style

Khasanov, I. S., Knyazev, B. A., Lobastov, S. A., Anisimov, A. V., Nikitin, P. A., & Kameshkov, O. E. (2023). Optical Characterization of Thin Films by Surface Plasmon Resonance Spectroscopy Using an Acousto-Optic Tunable Filter. Materials, 16(5), 1820. https://doi.org/10.3390/ma16051820

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