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Journal: MaterialsVolume: 16Number: 6358
Article: Interface Structure, Dielectric Behavior and Temperature Stability of Ba(Mg1/3Ta2/3)O3/PbZr0.52Ti0.48O3 Thin Films
- Authors:
- Zhi Wu1,
- Yifei Liu1,2 and
- Zhihui Qin1
- et al.
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