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Journal: Materials, 2022
Volume: 15
Number: 1943
Article:
Enhanced Switching Reliability of Sol–Gel-Processed Y2O3 RRAM Devices Based on Y2O3 Surface Roughness-Induced Local Electric Field
Authors:
by
Do-Won Kim, Hyeon-Joong Kim, Won-Yong Lee, Kyoungdu Kim, Sin-Hyung Lee, Jin-Hyuk Bae, In-Man Kang, Kwangeun Kim and Jaewon Jang
Link:
https://www.mdpi.com/1996-1944/15/5/1943
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