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Journal: Materials, 2022
Volume: 15
Number: 9067

Article: Remarkable Reduction in IG with an Explicit Investigation of the Leakage Conduction Mechanisms in a Dual Surface-Modified Al2O3/SiO2 Stack Layer AlGaN/GaN MOS-HEMT
Authors: by Soumen Mazumder, Parthasarathi Pal, Kuan-Wei Lee and Yeong-Her Wang
Link: https://www.mdpi.com/1996-1944/15/24/9067

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