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Journal: Materials, 2021
Volume: 14
Number: 4681
Article:
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
Authors:
by
Dorian Minkov, Emilio Marquez, George Angelov, Gavril Gavrilov, Susana Ruano and Elias Saugar
Link:
https://www.mdpi.com/1996-1944/14/16/4681
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