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Minkov D, Marquez E, Angelov G, Gavrilov G, Ruano S, Saugar E. Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum. Materials. 2021; 14(16):4681. https://doi.org/10.3390/ma14164681

Minkov, Dorian, Emilio Marquez, George Angelov, Gavril Gavrilov, Susana Ruano, and Elias Saugar. 2021. "Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum" Materials 14, no. 16: 4681. https://doi.org/10.3390/ma14164681

Minkov, D., Marquez, E., Angelov, G., Gavrilov, G., Ruano, S., & Saugar, E. (2021). Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum. Materials, 14(16), 4681. https://doi.org/10.3390/ma14164681