Minkov, D.; Marquez, E.; Angelov, G.; Gavrilov, G.; Ruano, S.; Saugar, E.
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum. Materials 2021, 14, 4681.
https://doi.org/10.3390/ma14164681
AMA Style
Minkov D, Marquez E, Angelov G, Gavrilov G, Ruano S, Saugar E.
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum. Materials. 2021; 14(16):4681.
https://doi.org/10.3390/ma14164681
Chicago/Turabian Style
Minkov, Dorian, Emilio Marquez, George Angelov, Gavril Gavrilov, Susana Ruano, and Elias Saugar.
2021. "Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum" Materials 14, no. 16: 4681.
https://doi.org/10.3390/ma14164681
APA Style
Minkov, D., Marquez, E., Angelov, G., Gavrilov, G., Ruano, S., & Saugar, E.
(2021). Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum. Materials, 14(16), 4681.
https://doi.org/10.3390/ma14164681