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Journal: Materials, 2021
Volume: 14
Number: 3570
Article:
Effects of Geometric and Crystallographic Factors on the Reliability of Al/Si Vertically Cracked Nanofilm/Substrate Systems
Authors:
by
Jee S. Shim, Dong H. Go and Hyeon G. Beom
Link:
https://www.mdpi.com/1996-1944/14/13/3570
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