Inbanathan, F.P.N.; Kumar, P.; Dasari, K.; Katiyar, R.S.; Chen, J.; Jadwisienczak, W.M.
Ellipsometry Study of CdSe Thin Films Deposited by PLD on ITO Coated Glass Substrates. Materials 2021, 14, 3307.
https://doi.org/10.3390/ma14123307
AMA Style
Inbanathan FPN, Kumar P, Dasari K, Katiyar RS, Chen J, Jadwisienczak WM.
Ellipsometry Study of CdSe Thin Films Deposited by PLD on ITO Coated Glass Substrates. Materials. 2021; 14(12):3307.
https://doi.org/10.3390/ma14123307
Chicago/Turabian Style
Inbanathan, Flavia P. N., Pawan Kumar, Kiran Dasari, Ram S. Katiyar, Jixin Chen, and Wojciech M. Jadwisienczak.
2021. "Ellipsometry Study of CdSe Thin Films Deposited by PLD on ITO Coated Glass Substrates" Materials 14, no. 12: 3307.
https://doi.org/10.3390/ma14123307
APA Style
Inbanathan, F. P. N., Kumar, P., Dasari, K., Katiyar, R. S., Chen, J., & Jadwisienczak, W. M.
(2021). Ellipsometry Study of CdSe Thin Films Deposited by PLD on ITO Coated Glass Substrates. Materials, 14(12), 3307.
https://doi.org/10.3390/ma14123307