Mukhopadhyay, A.K.; Roy, A.; Bhattacharjee, G.; Das, S.C.; Majumdar, A.; Wulff, H.; Hippler, R.
Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering. Materials 2021, 14, 3191.
https://doi.org/10.3390/ma14123191
AMA Style
Mukhopadhyay AK, Roy A, Bhattacharjee G, Das SC, Majumdar A, Wulff H, Hippler R.
Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering. Materials. 2021; 14(12):3191.
https://doi.org/10.3390/ma14123191
Chicago/Turabian Style
Mukhopadhyay, Arun Kumar, Avishek Roy, Gourab Bhattacharjee, Sadhan Chandra Das, Abhijit Majumdar, Harm Wulff, and Rainer Hippler.
2021. "Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering" Materials 14, no. 12: 3191.
https://doi.org/10.3390/ma14123191
APA Style
Mukhopadhyay, A. K., Roy, A., Bhattacharjee, G., Das, S. C., Majumdar, A., Wulff, H., & Hippler, R.
(2021). Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering. Materials, 14(12), 3191.
https://doi.org/10.3390/ma14123191