Shipulin, I.; Richter, S.; Thomas, A.A.; Nielsch, K.; Hühne, R.; Martovitsky, V.
Analysis of Electronic Properties from Magnetotransport Measurements on Ba(Fe1−xNix)2As2 Thin Films. Materials 2020, 13, 630.
https://doi.org/10.3390/ma13030630
AMA Style
Shipulin I, Richter S, Thomas AA, Nielsch K, Hühne R, Martovitsky V.
Analysis of Electronic Properties from Magnetotransport Measurements on Ba(Fe1−xNix)2As2 Thin Films. Materials. 2020; 13(3):630.
https://doi.org/10.3390/ma13030630
Chicago/Turabian Style
Shipulin, Ilya, Stefan Richter, Aleena Anna Thomas, Kornelius Nielsch, Ruben Hühne, and Victor Martovitsky.
2020. "Analysis of Electronic Properties from Magnetotransport Measurements on Ba(Fe1−xNix)2As2 Thin Films" Materials 13, no. 3: 630.
https://doi.org/10.3390/ma13030630
APA Style
Shipulin, I., Richter, S., Thomas, A. A., Nielsch, K., Hühne, R., & Martovitsky, V.
(2020). Analysis of Electronic Properties from Magnetotransport Measurements on Ba(Fe1−xNix)2As2 Thin Films. Materials, 13(3), 630.
https://doi.org/10.3390/ma13030630