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Optical Dielectric Loss as a Novel Approach to Specify the Types of Electron Transition: XRD and UV-vis as a Non-Destructive Techniques for Structural and Optical Characterization of PEO Based Nanocomposites
 
 

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Journal: Materials, 2020
Volume: 13
Number: 2980

Article: Towards a Correlation between Structural, Magnetic, and Luminescence Properties of CeF3:Tb3+ Nanocrystals
Authors: by Cristina Bartha, Corina Secu, Elena Matei, Catalin Negrila, Aurel Leca and Mihail Secu
Link: https://www.mdpi.com/1996-1944/13/13/2980

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