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Journal: Materials, 2020
Volume: 13
Number: 2816
Article:
Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps
Authors:
by
Aimo Winkelmann, Gert Nolze, Grzegorz Cios, Tomasz Tokarski and Piotr Bała
Link:
https://www.mdpi.com/1996-1944/13/12/2816
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