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Journal: Materials, 2019
Volume: 12
Number: 3972

Article: Impact of Line Edge Roughness on ReRAM Uniformity and Scaling
Authors: by Vassilios Constantoudis, George Papavieros, Panagiotis Karakolis, Ali Khiat, Themistoklis Prodromakis and Panagiotis Dimitrakis
Link: https://www.mdpi.com/1996-1944/12/23/3972

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