Native Point Defect Measurement and Manipulation in ZnO Nanostructures
Brillson, L.; Cox, J.; Gao, H.; Foster, G.; Ruane, W.; Jarjour, A.; Allen, M.; Look, D.; von Wenckstern, H.; Grundmann, M. Native Point Defect Measurement and Manipulation in ZnO Nanostructures. Materials 2019, 12, 2242. https://doi.org/10.3390/ma12142242
Brillson L, Cox J, Gao H, Foster G, Ruane W, Jarjour A, Allen M, Look D, von Wenckstern H, Grundmann M. Native Point Defect Measurement and Manipulation in ZnO Nanostructures. Materials. 2019; 12(14):2242. https://doi.org/10.3390/ma12142242
Chicago/Turabian StyleBrillson, Leonard; Cox, Jonathan; Gao, Hantian; Foster, Geoffrey; Ruane, William; Jarjour, Alexander; Allen, Martin; Look, David; von Wenckstern, Holger; Grundmann, Marius. 2019. "Native Point Defect Measurement and Manipulation in ZnO Nanostructures" Materials 12, no. 14: 2242. https://doi.org/10.3390/ma12142242