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Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation

Department of Engineering Science, University of Oxford, Oxford OX1 3PJ, UK
Department of Mechanical Engineering Sciences, University of Surrey, Guildford GU2 7XH, UK
Beamline I15, Diamond Light Source, Didcot OX11 0DE, UK
CERN, CH-1211 Geneva 23, Switzerland
Singapore Institute of Manufacturing Technology (SIMTech), 73 Nanyang Drive, Singapore 637662, Singapore
Author to whom correspondence should be addressed.
These authors contributed equally to this work.
Materials 2018, 11(3), 427;
Received: 19 February 2018 / Revised: 11 March 2018 / Accepted: 12 March 2018 / Published: 15 March 2018
(This article belongs to the Special Issue ICKEM2018 - Hierarchically Structured Materials (HSM))
PDF [2094 KB, uploaded 15 March 2018]


High energy 2D X-ray powder diffraction experiments are widely used for lattice strain measurement. The 2D to 1D conversion of diffraction patterns is a necessary step used to prepare the data for full pattern refinement, but is inefficient when only peak centre position information is required for lattice strain evaluation. The multi-step conversion process is likely to lead to increased errors associated with the ‘caking’ (radial binning) or fitting procedures. A new method is proposed here that relies on direct Digital Image Correlation analysis of 2D X-ray powder diffraction patterns (XRD-DIC, for short). As an example of using XRD-DIC, residual strain values along the central line in a Mg AZ31B alloy bar after 3-point bending are calculated by using both XRD-DIC and the conventional ‘caking’ with fitting procedures. Comparison of the results for strain values in different azimuthal angles demonstrates excellent agreement between the two methods. The principal strains and directions are calculated using multiple direction strain data, leading to full in-plane strain evaluation. It is therefore concluded that XRD-DIC provides a reliable and robust method for strain evaluation from 2D powder diffraction data. The XRD-DIC approach simplifies the analysis process by skipping 2D to 1D conversion, and opens new possibilities for robust 2D powder diffraction data analysis for full in-plane strain evaluation. View Full-Text
Keywords: 2D X-ray powder diffraction; strain measurement; Digital Image Correlation; 3-point bending 2D X-ray powder diffraction; strain measurement; Digital Image Correlation; 3-point bending

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Zhang, H.; Sui, T.; Salvati, E.; Daisenberger, D.; Lunt, A.J.G.; Fong, K.S.; Song, X.; Korsunsky, A.M. Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation. Materials 2018, 11, 427.

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