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Investigations on Structural, Optical and X-Radiation Responsive Properties of a-Se Thin Films Fabricated by Thermal Evaporation Method at Low Vacuum Degree

1
College of Optoelectronic Technology, Chengdu University of Information Technology, Chengdu 610225, China
2
College of Intelligent Manufacturing, Sichuan University of Arts and Science, Dazhou 635000, China
*
Author to whom correspondence should be addressed.
Materials 2018, 11(3), 368; https://doi.org/10.3390/ma11030368
Received: 19 January 2018 / Revised: 27 February 2018 / Accepted: 1 March 2018 / Published: 2 March 2018
(This article belongs to the Section Thin Films)
Amorphous selenium (a-Se) thin films with a thickness of 1200 nm were successfully fabricated by thermal evaporation at a low vacuum degree of 10−2 Pa. The structural properties involving phase and morphology showed that a-Se thin films could be resistant to 60 °C in air. Also, a transformation to polycrystalline Selenium (p-Se) was shown as the annealing temperature rose to 62 °C and 65 °C, with obvious changes in color and surface morphology. Moreover, as the a-Se transformed to p-Se, the samples’ transmittance decreased significantly, and the band gap declined dramatically from 2.15 eV to 1.92 eV. Finally, the X-radiation response of a-Se was investigated as an important property, revealing there is a remarkable response speed of photogeneration current both X-ray on and X-ray off, with a requirement of only a very small electrical field. View Full-Text
Keywords: amorphous selenium thin films; structure; optical properties; X-radiation response; thermal evaporation; low vacuum degree amorphous selenium thin films; structure; optical properties; X-radiation response; thermal evaporation; low vacuum degree
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MDPI and ACS Style

Li, J.; Zhu, X.; Yang, D.; Gu, P.; Wu, H. Investigations on Structural, Optical and X-Radiation Responsive Properties of a-Se Thin Films Fabricated by Thermal Evaporation Method at Low Vacuum Degree. Materials 2018, 11, 368.

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