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Materials 2017, 10(9), 1051;

Magnetoelectric Force Microscopy on Antiferromagnetic 180 Domains in Cr2O3

Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, 8093 Zürich, Switzerland
Department of Materials Science and Engineering, Norwegian University of Science and Technology, Sem Sælandsvei 12, 7034 Trondheim, Norway
These authors contributed equally to this work.
Author to whom correspondence should be addressed.
Received: 28 July 2017 / Revised: 18 August 2017 / Accepted: 23 August 2017 / Published: 7 September 2017
(This article belongs to the Special Issue Scanning Probe Microscopy of Ferroics)
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Magnetoelectric force microscopy (MeFM) is characterized as methodical tool for the investigation of antiferromagnetic domain states, in particular of the 180 variety. As reference compound for this investigation we use Cr 2 O 3 . Access to the antiferromagnetic order is provided by the linear magnetoelectric effect. We resolve the opposite antiferromagnetic 180 domain states of Cr 2 O 3 and estimate the sensitivity of the MeFM approach, its inherent advantages in comparison to alternative techniques and its general feasibility for probing antiferromagnetic order. View Full-Text
Keywords: magnetoelectric force microscopy; antiferromagnetic domains; Cr2O3; second harmonic generation magnetoelectric force microscopy; antiferromagnetic domains; Cr2O3; second harmonic generation

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Schoenherr, P.; Giraldo, L.M.; Lilienblum, M.; Trassin, M.; Meier, D.; Fiebig, M. Magnetoelectric Force Microscopy on Antiferromagnetic 180 Domains in Cr2O3. Materials 2017, 10, 1051.

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