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Materials 2017, 10(9), 1041;

Monitoring Ion Track Formation Using In Situ RBS/c, ToF-ERDA, and HR-PIXE

Ruđer Bošković Institute, Bijenička cesta 54, 10000 Zagreb, Croatia
Fakultät für Physik and CENIDE, Universität Duisburg-Essen, D-47048 Duisburg, Germany
Author to whom correspondence should be addressed.
Received: 9 August 2017 / Revised: 24 August 2017 / Accepted: 30 August 2017 / Published: 6 September 2017
(This article belongs to the Special Issue Ion Beam Analysis, Modification, and Irradiation of Materials)
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The aim of this work is to investigate the feasibility of ion beam analysis techniques for monitoring swift heavy ion track formation. First, the use of the in situ Rutherford backscattering spectrometry in channeling mode to observe damage build-up in quartz SiO2 after MeV heavy ion irradiation is demonstrated. Second, new results of the in situ grazing incidence time-of-flight elastic recoil detection analysis used for monitoring the surface elemental composition during ion tracks formation in various materials are presented. Ion tracks were found on SrTiO3, quartz SiO2, a-SiO2, and muscovite mica surfaces by atomic force microscopy, but in contrast to our previous studies on GaN and TiO2, surface stoichiometry remained unchanged. Third, the usability of high resolution particle induced X-ray spectroscopy for observation of electronic dynamics during early stages of ion track formation is shown. View Full-Text
Keywords: swift heavy ion; ion track; RBS/c; AFM; ERDA; PIXE swift heavy ion; ion track; RBS/c; AFM; ERDA; PIXE

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Karlušić, M.; Fazinić, S.; Siketić, Z.; Tadić, T.; Cosic, D.D.; Božičević-Mihalić, I.; Zamboni, I.; Jakšić, M.; Schleberger, M. Monitoring Ion Track Formation Using In Situ RBS/c, ToF-ERDA, and HR-PIXE. Materials 2017, 10, 1041.

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