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Journal: Energies, 2023
Volume: 16
Number: 2559

Article: Methods of Measurement of Die Temperature of Semiconductor Elements: A Review
Authors: by Krzysztof Dziarski, Arkadiusz Hulewicz, Piotr Kuwałek and Grzegorz Wiczyński
Link: https://www.mdpi.com/1996-1073/16/6/2559

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