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Journal: Energies, 2023
Volume: 16
Number: 6574
Article:
An Overview of Strengths and Weaknesses in Using MOSFET Experience for Modeling GaN HEMT
Authors:
by
Enrico Alfredo Bottaro and Santi Agatino Rizzo
Link:
https://www.mdpi.com/1996-1073/16/18/6574
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