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Journal: Energies, 2020
Volume: 13
Number: 1803
Article:
Wet Chemical Oxidation to Improve Interfacial Properties of Al2O3/Si and Interface Analysis of Al2O3/SiOx/Si Structure Using Surface Carrier Lifetime Simulation and Capacitance–Voltage Measurement
Authors:
by
Kwan Hong Min, Sungjin Choi, Myeong Sang Jeong, Sungeun Park, Min Gu Kang, Jeong In Lee, Yoonmook Kang, Donghwan Kim, Hae-Seok Lee and Hee-eun Song
Link:
https://www.mdpi.com/1996-1073/13/7/1803
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