Order Article Reprints

Min KH, Choi S, Jeong MS, Park S, Kang MG, Lee JI, Kang Y, Kim D, Lee H-S, Song H-e. Wet Chemical Oxidation to Improve Interfacial Properties of Al₂O₃/Si and Interface Analysis of Al₂O₃/SiO_x/Si Structure Using Surface Carrier Lifetime Simulation and Capacitance–Voltage Measurement. Energies. 2020; 13(7):1803. https://doi.org/10.3390/en13071803

Min, Kwan Hong, Sungjin Choi, Myeong Sang Jeong, Sungeun Park, Min Gu Kang, Jeong In Lee, Yoonmook Kang, Donghwan Kim, Hae-Seok Lee, and Hee-eun Song. 2020. "Wet Chemical Oxidation to Improve Interfacial Properties of Al₂O₃/Si and Interface Analysis of Al₂O₃/SiO_x/Si Structure Using Surface Carrier Lifetime Simulation and Capacitance–Voltage Measurement" Energies 13, no. 7: 1803. https://doi.org/10.3390/en13071803

Min, K. H., Choi, S., Jeong, M. S., Park, S., Kang, M. G., Lee, J. I., Kang, Y., Kim, D., Lee, H.-S., & Song, H.-e. (2020). Wet Chemical Oxidation to Improve Interfacial Properties of Al₂O₃/Si and Interface Analysis of Al₂O₃/SiO_x/Si Structure Using Surface Carrier Lifetime Simulation and Capacitance–Voltage Measurement. Energies, 13(7), 1803. https://doi.org/10.3390/en13071803