Spera, M.;                     Greco, G.;                     Lo Nigro, R.;                     Scalese, S.;                     Bongiorno, C.;                     Cannas, M.;                     Giannazzo, F.;                     Roccaforte, F.    
        Metal/Semiconductor Barrier Properties of Non-Recessed Ti/Al/Ti and Ta/Al/Ta Ohmic Contacts on AlGaN/GaN Heterostructures. Energies 2019, 12, 2655.
    https://doi.org/10.3390/en12142655
    AMA Style
    
                                Spera M,                                 Greco G,                                 Lo Nigro R,                                 Scalese S,                                 Bongiorno C,                                 Cannas M,                                 Giannazzo F,                                 Roccaforte F.        
                Metal/Semiconductor Barrier Properties of Non-Recessed Ti/Al/Ti and Ta/Al/Ta Ohmic Contacts on AlGaN/GaN Heterostructures. Energies. 2019; 12(14):2655.
        https://doi.org/10.3390/en12142655
    
    Chicago/Turabian Style
    
                                Spera, Monia,                                 Giuseppe Greco,                                 Raffaella Lo Nigro,                                 Silvia Scalese,                                 Corrado Bongiorno,                                 Marco Cannas,                                 Filippo Giannazzo,                                 and Fabrizio Roccaforte.        
                2019. "Metal/Semiconductor Barrier Properties of Non-Recessed Ti/Al/Ti and Ta/Al/Ta Ohmic Contacts on AlGaN/GaN Heterostructures" Energies 12, no. 14: 2655.
        https://doi.org/10.3390/en12142655
    
    APA Style
    
                                Spera, M.,                                 Greco, G.,                                 Lo Nigro, R.,                                 Scalese, S.,                                 Bongiorno, C.,                                 Cannas, M.,                                 Giannazzo, F.,                                 & Roccaforte, F.        
        
        (2019). Metal/Semiconductor Barrier Properties of Non-Recessed Ti/Al/Ti and Ta/Al/Ta Ohmic Contacts on AlGaN/GaN Heterostructures. Energies, 12(14), 2655.
        https://doi.org/10.3390/en12142655