Cross-Bonded Cable Circuits Identification Based on Deep Embedded Clustering of Sheath Current Sensing
Abstract
1. Introduction
- (1)
- A multi-circuit cross-bonded cable sheath equivalent circuit model was established, and the temporal similarity criterion for sheath currents within the same circuit was theoretically derived and validated, providing a physical foundation for online circuit identification.
- (2)
- The robustness of the temporal similarity under various practical conditions (cable configurations, cross-bonding section length deviations, load levels, and operating modes) was systematically verified using DTW distance metrics, demonstrating the feasibility and boundary conditions of the proposed criterion.
- (3)
- A deep embedded clustering framework combining TCN-AE and K-medoids was developed to transform circuit identification into an unsupervised temporal clustering problem. Its necessity and superiority compared to baseline methods were validated.
- (4)
- The proposed method was validated on a full-scale 110 kV cable test platform, proving its robustness against domain shifts and demonstrating significant practical value for intelligent operation and maintenance in urban power networks.
2. Calculation Model for Sheath Current of Multi-Circuit Shared-Tunnel HV Cables
2.1. Sheath Current Modeling Basis for Multi-Circuit Cross-Bonded HV Cable Systems
2.1.1. Theoretical Background
2.1.2. Leakage Current
2.1.3. Induced Current
2.2. Circulating Current Analysis
2.3. Definition of Identification Criterion Based on Temporal Similarity
3. Similarity Analysis of Sheath Currents
3.1. DTW-Based Similarity Metric and Evaluation Protocol
3.2. Analysis of Influencing Factors
3.2.1. Impact of Configuration and Cross-Bonding Section Length on Sheath Current Similarity
3.2.2. Impact of Load Level on Sheath Current Similarity
3.2.3. Impact of Operating Modes on Sheath Current Similarity
4. Circuit Identification Method Based on Deep Embedded Clustering
4.1. Problem Formulation and Input–Output Definition
4.2. Deep Embedded Clustering Framework
4.2.1. Temporal Convolutional Network
4.2.2. Autoencoder
4.2.3. Network Design
4.3. Case Study Analysis
4.4. Evaluation and Comparison
4.4.1. Metrics and Label Alignment for Clustering Evaluation
4.4.2. Quantitative Results and Ablation Study
4.4.3. Latent-Space Visualization
4.4.4. Representation Diagnostics and Latent Space Analysis
5. Field Application and Case Analysis
5.1. Test Platform and Measurement Setup
5.2. Online Deployment Pipeline and Stability Strategy
5.3. Field Identification Results and Representation Diagnostics
5.4. Analysis of Maximum and Mean Deviations Between Simulation and Experiment
5.5. Practical Considerations, Boundary Conditions, and Limitations
6. Conclusions
- (1)
- A TCN-AE-based cable circuit identification model was developed with optimized hyperparameters and network structure, achieving an accuracy of 95.37%. Representation diagnostics confirm that compared to the raw signal space, this nonlinear deep feature extraction significantly reduced the dispersion ratio of the latent features, demonstrating clear advantages over baseline methods
- (2)
- When the minor-section lengths of cross-bonded cables were identical, the induced components of sheath currents within the same circuit exhibited strong temporal consistency. DTW-based evaluations demonstrated that intra-circuit similarity remained higher than inter-circuit similarity across different system parameters and operating conditions, supporting temporal similarity as a reliable circuit identification criterion.
- (3)
- Simulation and experimental results further confirmed that the proposed method does not require direct load-current measurement and maintains stable identification performance under variations in minor-section length and cable configuration modes; these validate that the model remains highly robust against the simulation-to-reality domain gap.
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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| Similarity Level | Similarity Coefficient Range(S) | Circuit Relationship |
|---|---|---|
| High Similarity | 0.7~1.0 | Same Circuit |
| Transition Zone | 0.4~0.7 | Uncertain |
| Low Similarity | 0.0~0.4 | Different Circuit |
| Cable Parameter | Value | Cable Parameter | Value |
|---|---|---|---|
| Core outer diameter/mm | 38.9 | Sheath resistivity/Ω·m | 2.8 × 10−8 |
| Insulation outer diameter/mm | 70.9 | Grounding resistance/Ω·m | 0.5 |
| Sheath outer diameter/mm | 99.6 | Operating phase voltage/kV | 63.5 |
| Sheath inner diameter/mm | 97.3 | XLPE relative permittivity | 2.3 |
| Core resistivity/Ω·m | 1.68 × 10−8 | Soil resistivity/Ω·m | 100 |
| ARI | NMI | DBI | Silhouette |
|---|---|---|---|
| 0.581 | 0.665 | 0.303 | 0.865 |
| Algorithm | Accuracy/% | Precision/% | Recall/% | F1/% |
|---|---|---|---|---|
| TAE-K-medoids | 95.37 | 95.53 | 95.37 | 95.39 |
| TAE-K-means | 92.27 | 92.56 | 92.27 | 92.29 |
| LAE-K-medoids | 86.57 | 87.09 | 86.57 | 86.47 |
| K-medoids | 83.52 | 85.17 | 83.52 | 82.86 |
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© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
Share and Cite
Wang, H.; Li, Z.; Ding, W.; Tu, J.; Wang, L.; Chen, J. Cross-Bonded Cable Circuits Identification Based on Deep Embedded Clustering of Sheath Current Sensing. Sensors 2026, 26, 1591. https://doi.org/10.3390/s26051591
Wang H, Li Z, Ding W, Tu J, Wang L, Chen J. Cross-Bonded Cable Circuits Identification Based on Deep Embedded Clustering of Sheath Current Sensing. Sensors. 2026; 26(5):1591. https://doi.org/10.3390/s26051591
Chicago/Turabian StyleWang, Hang, Zhi Li, Wenfang Ding, Jing Tu, Liqiang Wang, and Jun Chen. 2026. "Cross-Bonded Cable Circuits Identification Based on Deep Embedded Clustering of Sheath Current Sensing" Sensors 26, no. 5: 1591. https://doi.org/10.3390/s26051591
APA StyleWang, H., Li, Z., Ding, W., Tu, J., Wang, L., & Chen, J. (2026). Cross-Bonded Cable Circuits Identification Based on Deep Embedded Clustering of Sheath Current Sensing. Sensors, 26(5), 1591. https://doi.org/10.3390/s26051591
