Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution
Abstract
1. Introduction
2. Materials and Methods
2.1. Kinematics
2.2. Numerical Simulations
| Parameter | Symbol | Value | Unit |
|---|---|---|---|
| Resonance Frequency | 62.291 | kHz | |
| Modal Stiffness | k | 28 | N/m |
| Quality Factor | 374 | ||
| Tip Radius | R | 17 | nm |
| Hamaker Constant [34] | A | J | |
| Intermolecular Distance [35] | 0.4 | nm | |
| Temperature | T | 300 | K |
| Boltzmann Constant | J/K | ||
| Measurement Bandwidth | B | 1 | kHz |
| Scaling Parameter Length | 1 | nm | |
| Scaling Parameter Mass | 1 | ng | |
| Scaling Parameter Temperature | 300 | K |
2.3. Noise Simulations
2.4. Experiments
3. Results
3.1. Comparison of Parametric Excitation Schemes
3.2. Numerical Analysis
3.2.1. General System Analysis
3.2.2. Approach Mechanism
3.2.3. Parameter Influence on Amplitude Noise
3.2.4. Parameter Influence on Amplitude–Distance Curves
3.3. Experimental Validation
3.4. Comparison to Conventional Forced Excitation
4. Discussion
5. Conclusions
Supplementary Materials
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
- Binnig, G.; Quate, C.F.; Gerber, C. Atomic force microscope. Phys. Rev. Lett. 1986, 56, 930–933. [Google Scholar] [CrossRef] [PubMed]
- Martin, Y.; Williams, C.C.; Wickramasinghe, H.K. Atomic force microscope–force mapping and profiling on a sub 100-Å scale. J. Appl. Phys. 1987, 61, 4723–4729. [Google Scholar] [CrossRef]
- García, R. Amplitude Modulation Atomic Force Microscopy; Wiley-VCH-Verl.: Weinheim, Germany, 2010. [Google Scholar]
- Ehrmann, J.; Sattel, T.; Radler, O. Exploring responsivity, sensitivity and resolution in amplitude modulated AFM: A study of global behavior and parameter influences. Microsyst. Nanoeng. 2026, 12, 63. [Google Scholar] [CrossRef] [PubMed]
- Schmid, S.; Villanueva, L.G.; Roukes, M.L. Fundamentals of Nanomechanical Resonators; Springer International Publishing: Cham, Switzerland, 2023. [Google Scholar] [CrossRef]
- Albrecht, T.R.; Grütter, P.; Horne, D.; Rugar, D. Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity. J. Appl. Phys. 1991, 69, 668–673. [Google Scholar] [CrossRef]
- Mertz, J.; Marti, O.; Mlynek, J. Regulation of a microcantilever response by force feedback. Appl. Phys. Lett. 1993, 62, 2344–2346. [Google Scholar] [CrossRef]
- Prakash, G.; Hu, S.; Raman, A.; Reifenberger, R. Theoretical basis of parametric-resonance-based atomic force microscopy. Phys. Rev. B 2009, 79, 094304. [Google Scholar] [CrossRef]
- Miller, J.M.L.; Ansari, A.; Heinz, D.B.; Chen, Y.; Flader, I.B.; Shin, D.D.; Villanueva, L.G.; Kenny, T.W. Effective quality factor tuning mechanisms in micromechanical resonators. Appl. Phys. Rev. 2018, 5, 041307. [Google Scholar] [CrossRef]
- Kovacic, I.; Rand, R.; Mohamed Sah, S. Mathieu’s Equation and Its Generalizations: Overview of Stability Charts and Their Features. Appl. Mech. Rev. 2018, 70, 020802. [Google Scholar] [CrossRef]
- Moreno-Moreno, M.; Raman, A.; Gomez-Herrero, J.; Reifenberger, R. Parametric resonance based scanning probe microscopy. Appl. Phys. Lett. 2006, 88, 193108. [Google Scholar] [CrossRef]
- Prakash, G.; Raman, A.; Rhoads, J.; Reifenberger, R.G. Parametric noise squeezing and parametric resonance of microcantilevers in air and liquid environments. Rev. Sci. Instrum. 2012, 83, 065109. [Google Scholar] [CrossRef] [PubMed]
- Rhoads, J.F.; Guo, C.; Fedder, G.K. Parametrically Excited Micro- and Nanosystems. In Resonant MEMS; Brand, O., Dufour, I., Heinrich, S.M., Josse, F., Eds.; Advanced Micro & Nanosystems; Wiley-VCH Verlag GmbH & Co. KGaA: Weinheim, Germany, 2015; pp. 73–95. [Google Scholar] [CrossRef]
- Napoli, M.; Baskaran, R.; Turner, K.; Bamieh, B. Understanding mechanical domain parametric resonance in microcantilevers. In Proceedings of the Sixteenth Annual International Conference on Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto; IEEE: Piscataway, NJ, USA, 2003; pp. 169–172. [Google Scholar] [CrossRef]
- Requa, M.V.; Turner, K.L. Electromechanically driven and sensed parametric resonance in silicon microcantilevers. Appl. Phys. Lett. 2006, 88, 263508. [Google Scholar] [CrossRef]
- Requa, M.; Turner, K. Enhanced Frequency Resolution in Parametrically Resonant Microcantilever Sensors. In Proceedings of the 2006 5th IEEE Conference on Sensors; IEEE: Daegu, Republic of Korea, 2006; pp. 311–314. [Google Scholar] [CrossRef]
- Requa, M.V.; Turner, K.L. Precise frequency estimation in a microelectromechanical parametric resonator. Appl. Phys. Lett. 2007, 90, 173508. [Google Scholar] [CrossRef]
- Westra, H.J.R.; Karabacak, D.M.; Brongersma, S.H.; Crego-Calama, M.; van der Zant, H.S.J.; Venstra, W.J. Interactions between directly- and parametrically-driven vibration modes in a micromechanical resonator. Phys. Rev. B 2011, 84, 134305. [Google Scholar] [CrossRef]
- Zhang, W.; Baskaran, R.; Turner, K.L. Effect of cubic nonlinearity on auto-parametrically amplified resonant MEMS mass sensor. Sens. Actuators A Phys. 2002, 102, 139–150. [Google Scholar] [CrossRef]
- Zhang, W.; Baskaran, R.; Turner, K. Tuning the dynamic behavior of parametric resonance in a micromechanical oscillator. Appl. Phys. Lett. 2003, 82, 130–132. [Google Scholar] [CrossRef]
- Zhang, W.; Baskaran, R.; Turner, K.L. Changing the behavior of parametric resonance in MEMS oscillators by tuning the effective cubic stiffness. In Proceedings of the Sixteenth Annual International Conference on Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto; IEEE: Piscataway, NJ, USA, 2003; pp. 173–176. [Google Scholar] [CrossRef]
- DeMartini, B.E.; Rhoads, J.F.; Turner, K.L.; Shaw, S.W.; Moehlis, J. Linear and Nonlinear Tuning of Parametrically Excited MEMS Oscillators. J. Microelectromech. Syst. 2007, 16, 310–318. [Google Scholar] [CrossRef]
- Villanueva, L.G.; Karabalin, R.B.; Matheny, M.H.; Kenig, E.; Cross, M.C.; Roukes, M.L. A nanoscale parametric feedback oscillator. Nano Lett. 2011, 11, 5054–5059. [Google Scholar] [CrossRef] [PubMed]
- Rhoads, J.F.; Shaw, S.W.; Turner, K.L.; Moehlis, J.; DeMartini, B.E.; Zhang, W. Generalized parametric resonance in electrostatically actuated microelectromechanical oscillators. J. Sound Vib. 2006, 296, 797–829. [Google Scholar] [CrossRef]
- Turner, K.L.; Miller, S.A.; Hartwell, P.G.; MacDonald, N.C.; Strogatz, S.H.; Adams, S.G. Five parametric resonances in a microelectromechanical system. Nature 1998, 396, 149–152. [Google Scholar] [CrossRef]
- Heer, C.V. Statistical Mechanics, Kinetic Theory, and Stochastic Processes; Elsevier: Amsterdam, The Netherlands, 1972. [Google Scholar] [CrossRef]
- Mil’stejn, G.N. Stochastic Numerics for Mathematical Physics: With … 28 Tables; Scientific Computation; Springer: Berlin/Heidelberg, Germany, 2004. [Google Scholar]
- Berthet, R.; Petrossian, A.; Residori, S.; Roman, B.; Fauve, S. Effect of multiplicative noise on parametric instabilities. Phys. D Nonlinear Phenom. 2003, 174, 84–99. [Google Scholar] [CrossRef]
- van Etten, W. Introduction to Random Signals and Noise; Wiley: Chichester, UK; Hoboken, NJ, USA, 2005. [Google Scholar]
- Gitterman, M.; Shrager, R.I.; Weiss, G.H. Influence of noise on systems described by a Mathieu equation. Phys. Lett. A 1989, 142, 84–88. [Google Scholar] [CrossRef]
- Zerbe, C.; Jung, P.; Hänggi, P. Brownian parametric oscillators. Phys. Rev. E Stat. Phys. Plasmas Fluids Interdiscip. Top. 1994, 49, 3626–3635. [Google Scholar] [CrossRef] [PubMed]
- Li, D. The Effects of Noise on Parametrically Excited Systems with Nonlinear Damping. Master’s Thesis, Florida Institute of Technology, Melbourne, FL, USA, 2021. [Google Scholar]
- Dankowicz, H.; Schilder, F. Recipes for Continuation; Computational Science & Engineering; SIAM Society for Industrial and Applied Mathematics: Philadelphia, PA, USA, 2013; Volume 11. [Google Scholar] [CrossRef]
- Bergström, L. Hamaker constants of inorganic materials. Adv. Colloid Interface Sci. 1997, 70, 125–169. [Google Scholar] [CrossRef]
- Pilania, G.; Thijsse, B.J.; Hoagland, R.G.; Lazić, I.; Valone, S.M.; Liu, X.Y. Revisiting the Al/Al2O3 interface: Coherent interfaces and misfit accommodation. Sci. Rep. 2014, 4, 4485. [Google Scholar] [CrossRef] [PubMed]
- The MathWorks, Inc. Band-Limited White Noise; The MathWorks, Inc.: Natick, MA, USA, 2026. [Google Scholar]
- Israelachvili, J.N. Intermolecular and Surface Forces; Elsevier Science: Burlington, MA, USA, 2010. [Google Scholar]
- Sarid, D.; Ruskell, T.G.; Workman, R.K.; Chen, D. Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operation. J. Vac. Sci. Technol. B Microelectron. Nanometer Struct. Proc. Meas. Phenom. 1996, 14, 864–867. [Google Scholar] [CrossRef]
- García, R. Dynamic atomic force microscopy methods. Surf. Sci. Rep. 2002, 47, 197–301. [Google Scholar] [CrossRef]
- Hölscher, H.; Schwarz, U.D.; Wiesendanger, R. Calculation of the frequency shift in dynamic force microscopy. Appl. Surf. Sci. 1999, 140, 344–351. [Google Scholar] [CrossRef]








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Ehrmann, J.; Radler, O.; Sattel, T. Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution. Sensors 2026, 26, 4791. https://doi.org/10.3390/s26154791
Ehrmann J, Radler O, Sattel T. Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution. Sensors. 2026; 26(15):4791. https://doi.org/10.3390/s26154791
Chicago/Turabian StyleEhrmann, Jonathan, Oliver Radler, and Thomas Sattel. 2026. "Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution" Sensors 26, no. 15: 4791. https://doi.org/10.3390/s26154791
APA StyleEhrmann, J., Radler, O., & Sattel, T. (2026). Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution. Sensors, 26(15), 4791. https://doi.org/10.3390/s26154791

