Son, M.; Kim, J.; Song, Y.; Kim, J.; Choi, J.; Kim, J.
Wafer-Based Evaluation of the Effects of Center Frequency and F-Number on Lateral Resolution in Scanning Acoustic Microscopy. Sensors 2026, 26, 4058.
https://doi.org/10.3390/s26134058
AMA Style
Son M, Kim J, Song Y, Kim J, Choi J, Kim J.
Wafer-Based Evaluation of the Effects of Center Frequency and F-Number on Lateral Resolution in Scanning Acoustic Microscopy. Sensors. 2026; 26(13):4058.
https://doi.org/10.3390/s26134058
Chicago/Turabian Style
Son, Minseok, Jincheol Kim, Yuon Song, Juho Kim, Jongmyoung Choi, and Jeesu Kim.
2026. "Wafer-Based Evaluation of the Effects of Center Frequency and F-Number on Lateral Resolution in Scanning Acoustic Microscopy" Sensors 26, no. 13: 4058.
https://doi.org/10.3390/s26134058
APA Style
Son, M., Kim, J., Song, Y., Kim, J., Choi, J., & Kim, J.
(2026). Wafer-Based Evaluation of the Effects of Center Frequency and F-Number on Lateral Resolution in Scanning Acoustic Microscopy. Sensors, 26(13), 4058.
https://doi.org/10.3390/s26134058