In Vitro Repeatability and Inter-Device Agreement of Higher-Order Aberration Measurements in Scleral Lenses Using Two Hartmann–Shack Metrology Devices
Abstract
1. Introduction
2. Materials and Methods
2.1. Instrumentation
2.2. Sample Lenses
2.3. Measurement Protocol
2.4. Statistical Analysis
3. Results
4. Discussion
5. Conclusions
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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| Parameter | SHSOphthalmic Cito | SHSInspect Prio |
|---|---|---|
| Image | ![]() | ![]() |
| Technology | HS wavefront sensor | HS wavefront sensor |
| Lenslet array (lateral resolution) | 54 × 54 measurement points | 157 × 157 measurement points |
| Field of view (refractive data) | 8.00 mm | 8.50 mm |
| Wavelength | 540 ± 10 nm * | 540 ± 10 nm * |
| Spherical power range (air) | −30 to +30 D | −35 to +35 D |
| Power reproducibility | <0.02 D (1 σ, lens moved) | <0.02 D (1 σ, lens moved) |
| Power repeatability | <0.002 D (1 σ, lens not moved) | <0.002 D (1 σ, lens not moved) |
| Measurement duration | <0.2 s | 0.2 to 1.0 s |
| BOZR (mm) | Sagittal Depth (µm) | Power (D) | Thickness Profile * |
|---|---|---|---|
| 9.00 | 4400 | +3.00 | ![]() |
| 8.50 | 4600 | +0.75 | ![]() |
| 8.00 | 4800 | −1.75 | ![]() |
| 7.50 | 5000 | −4.50 | ![]() |
| SHSOphthalmic Cito (54 × 54) | SHSInspect Prio (157 × 157) | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| Metric | Aperture (mm) | SW | CV (%) | RC | ICC | SW | CV (%) | RC | ICC |
| Sphere (D) | 3 | 0.0080 | — | 0.0222 | 1.000 | 0.0026 | — | 0.0073 | 1.000 |
| 5 | 0.0018 | — | 0.0051 | 1.000 | 0.0009 | — | 0.0024 | 1.000 | |
| 7 | 0.0022 | — | 0.0060 | 1.000 | 0.0015 | — | 0.0042 | 1.000 | |
| RMS 3rd order (µm) | 3 | 0.0008 | 17.8 | 0.0022 | 0.842 | 0.0009 | 18.5 | 0.0024 | 0.876 |
| 5 | 0.0015 | 11.4 | 0.0041 | 0.942 | 0.0019 | 13.8 | 0.0053 | 0.908 | |
| 7 | 0.0046 | 14.4 | 0.0128 | 0.890 | 0.0062 | 18.3 | 0.0173 | 0.808 | |
| RMS 4th order (µm) | 3 | 0.0005 | 3.7 | 0.0015 | 0.996 | 0.0004 | 2.6 | 0.0011 | 0.998 |
| 5 | 0.0004 | 0.4 | 0.0011 | 1.000 | 0.0021 | 2.3 | 0.0059 | 0.999 | |
| 7 | 0.0021 | 0.5 | 0.0057 | 1.000 | 0.0005 | 0.1 | 0.0014 | 1.000 | |
| RMS 5th order (µm) | 3 | 0.0005 | 21.0 | 0.0014 | 0.591 | 0.0004 | 18.4 | 0.0011 | 0.843 |
| 5 | 0.0005 | 15.0 | 0.0015 | 0.916 | 0.0005 | 12.7 | 0.0013 | 0.942 | |
| 7 | 0.0005 | 7.3 | 0.0014 | 0.964 | 0.0008 | 11.7 | 0.0022 | 0.909 | |
| Total HOA RMS (µm) | 3 | 0.0006 | 4.0 | 0.0017 | 0.994 | 0.0005 | 3.0 | 0.0013 | 0.997 |
| 5 | 0.0004 | 0.4 | 0.0011 | 1.000 | 0.0021 | 2.2 | 0.0058 | 0.999 | |
| 7 | 0.0020 | 0.5 | 0.0055 | 1.000 | 0.0007 | 0.2 | 0.0021 | 1.000 | |
| Metric | Aperture (mm) | Bias | LoA Lower | LoA Upper | ICC | p-Value |
|---|---|---|---|---|---|---|
| Sphere (D) | 3 | −0.00452 | −0.02749 | +0.01846 | 1.000 | 0.1442 |
| 5 | −0.00297 | −0.03034 | +0.02440 | 1.000 | 0.3484 | |
| 7 | −0.00545 | −0.04431 | +0.03341 | 1.000 | 0.2889 | |
| RMS 3rd order (µm) | 3 | −0.00012 | −0.00215 | +0.00191 | 0.886 | 0.5619 |
| 5 | −0.00066 | −0.00430 | +0.00298 | 0.950 | 0.5619 | |
| 7 | −0.00185 | −0.00810 | +0.00439 | 0.964 | 0.0342 * | |
| RMS 4th order (µm) | 3 | −0.00102 | −0.00200 | −0.00003 | 0.991 | <0.001 *** |
| 5 | +0.00058 | −0.00537 | +0.00653 | 0.999 | 0.4564 | |
| 7 | +0.00188 | −0.01220 | +0.01597 | 1.000 | 0.3108 | |
| RMS 5th order (µm) | 3 | +0.00015 | −0.00099 | +0.00129 | 0.756 | 0.3258 |
| 5 | −0.00004 | −0.00085 | +0.00078 | 0.976 | 0.7286 | |
| 7 | −0.00001 | −0.00116 | +0.00114 | 0.976 | 0.9424 | |
| Total HOA RMS (µm) | 3 | −0.00092 | −0.00222 | +0.00038 | 0.991 | <0.001 *** |
| 5 | +0.00055 | −0.00509 | +0.00618 | 0.999 | 0.4584 | |
| 7 | +0.00177 | −0.01219 | +0.01573 | 1.000 | 0.3358 |
| Metric | Aperture (mm) | FSE (p-Value) | TP (p-Value) | Interaction (p-Value) |
|---|---|---|---|---|
| Sphere (D) | 3 | 0.387 | 0.553 | 0.138 |
| 5 | 0.488 | 0.986 | 0.984 | |
| 7 | 0.202 | 0.830 | 0.796 | |
| RMS 3rd order (µm) | 3 | 0.079 | 0.137 | 0.468 |
| 5 | 0.159 | 0.984 | 0.521 | |
| 7 | 0.251 | 0.529 | 0.445 | |
| RMS 4th order (µm) | 3 | 0.876 | 0.899 | 0.553 |
| 5 | 0.915 | 0.583 | 0.804 | |
| 7 | 0.653 | 0.823 | 0.921 | |
| RMS 5th order (µm) | 3 | 0.239 | 0.183 | 0.689 |
| 5 | 0.693 | 0.344 | 0.270 | |
| 7 | 0.050 | 0.762 | 0.415 | |
| Total HOA RMS (µm) | 3 | 0.079 | 0.191 | 0.722 |
| 5 | 0.854 | 0.538 | 0.698 | |
| 7 | 0.662 | 0.823 | 0.962 |
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Viviano, F.; Iovino, M.; Macedo-de-Araújo, R.J.; González-Meijome, J.M. In Vitro Repeatability and Inter-Device Agreement of Higher-Order Aberration Measurements in Scleral Lenses Using Two Hartmann–Shack Metrology Devices. Sensors 2026, 26, 3282. https://doi.org/10.3390/s26113282
Viviano F, Iovino M, Macedo-de-Araújo RJ, González-Meijome JM. In Vitro Repeatability and Inter-Device Agreement of Higher-Order Aberration Measurements in Scleral Lenses Using Two Hartmann–Shack Metrology Devices. Sensors. 2026; 26(11):3282. https://doi.org/10.3390/s26113282
Chicago/Turabian StyleViviano, Francesco, Marco Iovino, Rute J. Macedo-de-Araújo, and José Manuel González-Meijome. 2026. "In Vitro Repeatability and Inter-Device Agreement of Higher-Order Aberration Measurements in Scleral Lenses Using Two Hartmann–Shack Metrology Devices" Sensors 26, no. 11: 3282. https://doi.org/10.3390/s26113282
APA StyleViviano, F., Iovino, M., Macedo-de-Araújo, R. J., & González-Meijome, J. M. (2026). In Vitro Repeatability and Inter-Device Agreement of Higher-Order Aberration Measurements in Scleral Lenses Using Two Hartmann–Shack Metrology Devices. Sensors, 26(11), 3282. https://doi.org/10.3390/s26113282







