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Journal: Sensors, 2026
Volume: 26
Number: 64
Article:
A Fully Integrated Monolithic Monitor for Aging-Induced Leakage Current Characterization
Authors:
by
Emmanuel Nti Darko, Saeid Karimpour, Daniel Adjei, Kelvin Tamakloe and Degang Chen
Link:
https://www.mdpi.com/1424-8220/26/1/64
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