Chao, C.Y.-P.; Wu, T.M.-H.; Liu, C.C.-M.; Yeh, S.-F.; Lee, C.-L.; Tu, H.; Wu, Z.-D.; Huang, J.C.-Y.; Chang, C.-H.
High-Temperature Annealing of Random Telegraph Noise in a Stacked CMOS Image Sensor After Hot-Carrier Stress. Sensors 2026, 26, 282.
https://doi.org/10.3390/s26010282
AMA Style
Chao CY-P, Wu TM-H, Liu CC-M, Yeh S-F, Lee C-L, Tu H, Wu Z-D, Huang JC-Y, Chang C-H.
High-Temperature Annealing of Random Telegraph Noise in a Stacked CMOS Image Sensor After Hot-Carrier Stress. Sensors. 2026; 26(1):282.
https://doi.org/10.3390/s26010282
Chicago/Turabian Style
Chao, Calvin Yi-Ping, Thomas Meng-Hsiu Wu, Charles Chih-Min Liu, Shang-Fu Yeh, Chih-Lin Lee, Honyih Tu, Zhong-Da Wu, Joey Chiao-Yi Huang, and Chin-Hao Chang.
2026. "High-Temperature Annealing of Random Telegraph Noise in a Stacked CMOS Image Sensor After Hot-Carrier Stress" Sensors 26, no. 1: 282.
https://doi.org/10.3390/s26010282
APA Style
Chao, C. Y.-P., Wu, T. M.-H., Liu, C. C.-M., Yeh, S.-F., Lee, C.-L., Tu, H., Wu, Z.-D., Huang, J. C.-Y., & Chang, C.-H.
(2026). High-Temperature Annealing of Random Telegraph Noise in a Stacked CMOS Image Sensor After Hot-Carrier Stress. Sensors, 26(1), 282.
https://doi.org/10.3390/s26010282
