Nguyen, V.-H.; Pham, T.-N.; Huh, J.-H.; Choi, P.-J.; Kim, Y.-B.; Kwon, O.-H.; Kwon, K.-R.
Efficient Synthetic Defect on 3D Object Reconstruction and Generation Pipeline for Digital Twins Smart Factory. Sensors 2025, 25, 6908.
https://doi.org/10.3390/s25226908
AMA Style
Nguyen V-H, Pham T-N, Huh J-H, Choi P-J, Kim Y-B, Kwon O-H, Kwon K-R.
Efficient Synthetic Defect on 3D Object Reconstruction and Generation Pipeline for Digital Twins Smart Factory. Sensors. 2025; 25(22):6908.
https://doi.org/10.3390/s25226908
Chicago/Turabian Style
Nguyen, Viet-Hoan, Thi-Ngot Pham, Jun-Ho Huh, Pil-Joo Choi, Young-Bong Kim, Oh-Heum Kwon, and Ki-Ryong Kwon.
2025. "Efficient Synthetic Defect on 3D Object Reconstruction and Generation Pipeline for Digital Twins Smart Factory" Sensors 25, no. 22: 6908.
https://doi.org/10.3390/s25226908
APA Style
Nguyen, V.-H., Pham, T.-N., Huh, J.-H., Choi, P.-J., Kim, Y.-B., Kwon, O.-H., & Kwon, K.-R.
(2025). Efficient Synthetic Defect on 3D Object Reconstruction and Generation Pipeline for Digital Twins Smart Factory. Sensors, 25(22), 6908.
https://doi.org/10.3390/s25226908
