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Journal: Sensors, 2025
Volume: 25
Number: 6614
Article:
DB-YOLO: A Dual-Branch Parallel Industrial Defect Detection Network
Authors:
by
Ziling Fan, Yan Zhao, Chaofu Liu and Jinliang Qiu
Link:
https://www.mdpi.com/1424-8220/25/21/6614
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