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Journal: Sensors, 2025
Volume: 25
Number: 6470

Article: A Semi-Automatic Labeling Framework for PCB Defects via Deep Embeddings and Density-Aware Clustering
Authors: by Sang-Jeong Lee, Sung-Bal Seo and You-Suk Bae
Link: https://www.mdpi.com/1424-8220/25/20/6470

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