Cao, J.; Bian, Y.; He, C.; Liu, F.; Xu, D.; Guo, Y.
Evaluation of Connectivity Reliability of VANETs Considering Node Mobility and Multiple Failure Modes. Sensors 2025, 25, 6073.
https://doi.org/10.3390/s25196073
AMA Style
Cao J, Bian Y, He C, Liu F, Xu D, Guo Y.
Evaluation of Connectivity Reliability of VANETs Considering Node Mobility and Multiple Failure Modes. Sensors. 2025; 25(19):6073.
https://doi.org/10.3390/s25196073
Chicago/Turabian Style
Cao, Junhai, Yunlong Bian, Chengming He, Fusheng Liu, Dan Xu, and Yiming Guo.
2025. "Evaluation of Connectivity Reliability of VANETs Considering Node Mobility and Multiple Failure Modes" Sensors 25, no. 19: 6073.
https://doi.org/10.3390/s25196073
APA Style
Cao, J., Bian, Y., He, C., Liu, F., Xu, D., & Guo, Y.
(2025). Evaluation of Connectivity Reliability of VANETs Considering Node Mobility and Multiple Failure Modes. Sensors, 25(19), 6073.
https://doi.org/10.3390/s25196073