Min, H.; Zhang, Z.; Fan, T.; Zhang, P.; Zhang, C.; Qu, G.
Full Coverage Testing Method for Automated Driving System in Logical Scenario Parameters Space. Sensors 2025, 25, 5764.
https://doi.org/10.3390/s25185764
AMA Style
Min H, Zhang Z, Fan T, Zhang P, Zhang C, Qu G.
Full Coverage Testing Method for Automated Driving System in Logical Scenario Parameters Space. Sensors. 2025; 25(18):5764.
https://doi.org/10.3390/s25185764
Chicago/Turabian Style
Min, Haitao, Zhiqiang Zhang, Tianxin Fan, Peixing Zhang, Cheng Zhang, and Ge Qu.
2025. "Full Coverage Testing Method for Automated Driving System in Logical Scenario Parameters Space" Sensors 25, no. 18: 5764.
https://doi.org/10.3390/s25185764
APA Style
Min, H., Zhang, Z., Fan, T., Zhang, P., Zhang, C., & Qu, G.
(2025). Full Coverage Testing Method for Automated Driving System in Logical Scenario Parameters Space. Sensors, 25(18), 5764.
https://doi.org/10.3390/s25185764