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Journal: Sensors, 2025
Volume: 25
Number: 4534
Article:
A New Method of Remaining Useful Lifetime Estimation for a Degradation Process with Random Jumps
Authors:
by
Yue Zhuo, Lei Feng, Jianxun Zhang, Xiaosheng Si and Zhengxin Zhang
Link:
https://www.mdpi.com/1424-8220/25/15/4534
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