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Journal: Sensors, 2024
Volume: 24
Number: 1998

Article: Crop Leaf Phenotypic Parameter Measurement Based on the RKM-D Point Cloud Method
Authors: by Weiyi Mu, Yuanxin Li, Mingjiang Deng, Ning Han and Xin Guo
Link: https://www.mdpi.com/1424-8220/24/6/1998

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