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Journal: Sensors, 2024
Volume: 24
Number: 1998
Article:
Crop Leaf Phenotypic Parameter Measurement Based on the RKM-D Point Cloud Method
Authors:
by
Weiyi Mu, Yuanxin Li, Mingjiang Deng, Ning Han and Xin Guo
Link:
https://www.mdpi.com/1424-8220/24/6/1998
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