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Journal: Sensors, 2024
Volume: 24
Number: 4276
Article:
A Machine Learning Approach to Predict Radiation Effects in Microelectronic Components
Authors:
by
Fernando Morilla, Jesús Vega, Sebastián Dormido-Canto, Amor Romero-Maestre, José de-MartÃn-Hernández, Yolanda Morilla, Pedro MartÃn-Holgado and Manuel DomÃnguez
Link:
https://www.mdpi.com/1424-8220/24/13/4276
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