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Journal: Sensors, 2023
Volume: 23
Number: 3583
Article:
Statistical Characterization and Modeling of Indoor RF-EMF Down-Link Exposure
Authors:
by
Biruk Ashenafi Mulugeta, Shanshan Wang, Wassim Ben Chikha, Jiang Liu, Christophe Roblin and Joe Wiart
Link:
https://www.mdpi.com/1424-8220/23/7/3583
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