Chen, J.; Wang, B.; Chen, X.; Jiang, Q.; Feng, W.; Xu, Z.; Zhao, Z.
A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry. Sensors 2023, 23, 8307.
https://doi.org/10.3390/s23198307
AMA Style
Chen J, Wang B, Chen X, Jiang Q, Feng W, Xu Z, Zhao Z.
A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry. Sensors. 2023; 23(19):8307.
https://doi.org/10.3390/s23198307
Chicago/Turabian Style
Chen, Junying, Boxuan Wang, Xiuyu Chen, Qingshan Jiang, Wei Feng, Zhilong Xu, and Zhenye Zhao.
2023. "A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry" Sensors 23, no. 19: 8307.
https://doi.org/10.3390/s23198307
APA Style
Chen, J., Wang, B., Chen, X., Jiang, Q., Feng, W., Xu, Z., & Zhao, Z.
(2023). A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry. Sensors, 23(19), 8307.
https://doi.org/10.3390/s23198307
