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Journal: Sensors, 2023
Volume: 23
Number: 7579

Article: Rectangular Amplitude Mask-Based Auto-Focus Method with a Large Range and High Precision for a Micro-LED Wafer Defects Detection System
Authors: by Wenjun He, Yufeng Ma and Wenbo Wang
Link: https://www.mdpi.com/1424-8220/23/17/7579

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