Yang, Z.; Chen, F.; Xu, B.; Ma, B.; Qu, Z.; Zhou, X.
Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions. Sensors 2023, 23, 6951.
https://doi.org/10.3390/s23156951
AMA Style
Yang Z, Chen F, Xu B, Ma B, Qu Z, Zhou X.
Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions. Sensors. 2023; 23(15):6951.
https://doi.org/10.3390/s23156951
Chicago/Turabian Style
Yang, Zheng, Fei Chen, Binbin Xu, Boquan Ma, Zege Qu, and Xin Zhou.
2023. "Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions" Sensors 23, no. 15: 6951.
https://doi.org/10.3390/s23156951
APA Style
Yang, Z., Chen, F., Xu, B., Ma, B., Qu, Z., & Zhou, X.
(2023). Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions. Sensors, 23(15), 6951.
https://doi.org/10.3390/s23156951