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Journal: Sensors, 2023
Volume: 23
Number: 5725
Article:
Bistable Boron-Related Defect Associated with the Acceptor Removal Process in Irradiated p-Type Silicon—Electronic Properties of Configurational Transformations
Authors:
by
Andrei Nitescu, Cristina Besleaga, George Alexandru Nemnes and Ioana Pintilie
Link:
https://www.mdpi.com/1424-8220/23/12/5725
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