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Journal: Sensors, 2023
Volume: 23
Number: 325

Article: Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing
Authors: by António Ramos Silva, Mário Vaz, Sofia Leite and Joaquim Mendes
Link: https://www.mdpi.com/1424-8220/23/1/325

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