Ramos Silva, A.; Vaz, M.; Leite, S.; Mendes, J.
Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing. Sensors 2023, 23, 325.
https://doi.org/10.3390/s23010325
AMA Style
Ramos Silva A, Vaz M, Leite S, Mendes J.
Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing. Sensors. 2023; 23(1):325.
https://doi.org/10.3390/s23010325
Chicago/Turabian Style
Ramos Silva, António, Mário Vaz, Sofia Leite, and Joaquim Mendes.
2023. "Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing" Sensors 23, no. 1: 325.
https://doi.org/10.3390/s23010325
APA Style
Ramos Silva, A., Vaz, M., Leite, S., & Mendes, J.
(2023). Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing. Sensors, 23(1), 325.
https://doi.org/10.3390/s23010325