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Journal: Sensors, 2022
Volume: 22
Number: 3477
Article:
Terahertz Multiple Echoes Correction and Non-Destructive Testing Based on Improved Wavelet Multi-Scale Analysis
Authors:
by
Weihua Xiong, Lijuan Li, Jiaojiao Ren, Jian Gu, Dandan Zhang and Junwen Xue
Link:
https://www.mdpi.com/1424-8220/22/9/3477
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