RodrÃguez Varela, F.; López Morales, M.J.; Tena Sánchez, R.; Muriel Barrado, A.T.; de la Fuente González, E.; Posada Quijano, G.; Zarzuelo Torres, C.; Sierra Pérez, M.; Sierra Castañer, M.
Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays. Sensors 2021, 21, 1744.
https://doi.org/10.3390/s21051744
AMA Style
RodrÃguez Varela F, López Morales MJ, Tena Sánchez R, Muriel Barrado AT, de la Fuente González E, Posada Quijano G, Zarzuelo Torres C, Sierra Pérez M, Sierra Castañer M.
Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays. Sensors. 2021; 21(5):1744.
https://doi.org/10.3390/s21051744
Chicago/Turabian Style
RodrÃguez Varela, Fernando, Manuel José López Morales, Rubén Tena Sánchez, Alfonso Tomás Muriel Barrado, Elena de la Fuente González, Guillermo Posada Quijano, Carlos Zarzuelo Torres, Manuel Sierra Pérez, and Manuel Sierra Castañer.
2021. "Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays" Sensors 21, no. 5: 1744.
https://doi.org/10.3390/s21051744
APA Style
RodrÃguez Varela, F., López Morales, M. J., Tena Sánchez, R., Muriel Barrado, A. T., de la Fuente González, E., Posada Quijano, G., Zarzuelo Torres, C., Sierra Pérez, M., & Sierra Castañer, M.
(2021). Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays. Sensors, 21(5), 1744.
https://doi.org/10.3390/s21051744
