Order Article Reprints

Malsagova KA, Popov VP, Kupriyanov IN, Pleshakova TO, Galiullin RA, Kozlov AF, Shumov ID, Larionov DI, Tikhonenko FV, Kapustina SI, et al. Raman Spectroscopy-Based Quality Control of “Silicon-On-Insulator” Nanowire Chips for the Detection of Brain Cancer-Associated MicroRNA in Plasma. Sensors. 2021; 21(4):1333. https://doi.org/10.3390/s21041333

Malsagova, Kristina A., Vladimir P. Popov, Igor N. Kupriyanov, Tatyana O. Pleshakova, Rafael A. Galiullin, Andrey F. Kozlov, Ivan D. Shumov, Dmitry I. Larionov, Fedor V. Tikhonenko, Svetlana I. Kapustina, and et al. 2021. "Raman Spectroscopy-Based Quality Control of “Silicon-On-Insulator” Nanowire Chips for the Detection of Brain Cancer-Associated MicroRNA in Plasma" Sensors 21, no. 4: 1333. https://doi.org/10.3390/s21041333

Malsagova, K. A., Popov, V. P., Kupriyanov, I. N., Pleshakova, T. O., Galiullin, R. A., Kozlov, A. F., Shumov, I. D., Larionov, D. I., Tikhonenko, F. V., Kapustina, S. I., Ziborov, V. S., Petrov, O. F., Gadzhieva, O. A., Bashiryan, B. A., Shimansky, V. N., Archakov, A. I., & Ivanov, Y. D. (2021). Raman Spectroscopy-Based Quality Control of “Silicon-On-Insulator” Nanowire Chips for the Detection of Brain Cancer-Associated MicroRNA in Plasma. Sensors, 21(4), 1333. https://doi.org/10.3390/s21041333